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Huis > producten > Vroegproefsonden >
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Double-head test probe for IC testing

Spring contact pin with warranty

YOUFU UF-FTO55FD030-002 test probe

Plaats van herkomst:

China

Merknaam:

WINNER

Certificering:

ISO9100

Contacteer ons
Verzoek om een Citaat
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002
Productdetails
Productnaam:
veerproefsonde
loop:
PB, goudkleurig
Onderste plunjer:
BeCu/SK4, verguld
TOP plunjer:
SK4(Be Cu)/Verguld
Lente:
SWPB(SUS)/Verguld
Beschikbaarheid:
Aangepaste maten beschikbaar
Coating:
Verguld met goud
Huidige beoordeling:
3A
Neem contact op met Weerstand:
Maximaal 50 MOhm
Bandbreedte:
-0,19 dB @ 19,6 GHz
inductie:
1,15 nH
Captance:
1,41 pF
Volledige slag:
0,7 mm
Nominale slag:
0,5 MM
Vlamkracht:
25 gram bij 0,5 mm
De mechanische levensduur is overschreden:
200k
Markeren:

Double-head test probe for IC testing

,

Spring contact pin with warranty

,

YOUFU UF-FTO55FD030-002 test probe

Betaling & het Verschepen Termijnen
Min. bestelaantal
3000 pccs
Prijs
999
Verpakking Details
Neutrale verpakking of met OEM -logo
Levertijd
5-8 werkdagen
Betalingscondities
L/C,Western Union,T/T
Levering vermogen
100000 rollen per maand
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Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for IC Testing

Krijg Beste Prijs
Contacteer ons
Contact nu
Productomschrijving
Dual-Head High-Frequency IC Test Probe YOUFU UF-FTO55FD030-002
High Quality Switch Contact Pin Test Probe YF DE2-055BB30-01C0. Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities.
Key Product Features
  • High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
  • Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
  • Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
  • Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory
Product Images
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Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 1


Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 2
Detailed Component Illustration
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 3
Comparison of different test probe tip types and configurations
Customization Options
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:
  • Custom diameters to match your specific requirements
  • Custom plating thicknesses for optimal conductivity and durability
  • Custom mechanical specifications tailored to your application
All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.
Manufacturing Process
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 4
Our probe manufacturing facility
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 5
Quality control inspection
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 6
Packaged probes ready for shipment
Markeringen：

Goudgeplatte wolfraamelektronica

0.01mm wolfraamdraad

elektronica van molybdeendraad

Rechtstreeks uw onderzoek naar verzend ons

Tel.：86-158-1857-6616
E-mail：sales@winner-sc.com
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