Name: Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Plaats van herkomst:

China

Merknaam:

WINNER

Certificering:

ISO9100

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Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Productdetails

Productnaam:

veerproefsonde

loop:

PB, goudkleurig

Onderste plunjer:

BeCu/SK4, verguld

TOP plunjer:

Pd-legering/geen verguld

Lente:

SWPB(SUS)/Verguld

Beschikbaarheid:

Aangepaste maten beschikbaar

Coating:

Verguld met goud

Huidige beoordeling:

Neem contact op met Weerstand:

Maximaal 100 MOhm

Bandbreedte:

-0,17 dB @ 19,6 GHz

inductie:

1,25nH

Captance:

1,61 pF

Volledige slag:

1,00 mm

Nominale slag:

0,65 mm

Vlamkracht:

30gram@o.65mm

De mechanische levensduur is overschreden:

200k

Markeren:

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Betaling & het Verschepen Termijnen

Min. bestelaantal

3000 pccs

Prijs

999

Verpakking Details

Neutrale verpakking of met OEM -logo

Levertijd

5-8 werkdagen

Betalingscondities

L/C,Western Union,T/T

Levering vermogen

100000 rollen per maand

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Productomschrijving

High Efficiency BGA Testing Probes

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.

Key Product Features

Ultra-Fine Precision: 0.11 mm plunger and 0.15 mm barrel for micro-pitch PCB pads, IC leads, flex circuits, and semiconductor testing
High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Production Specifications

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Markeringen：

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

China Supplier ICT test probe P048

CHINA Supply YF-100 Brass Material Spring Contact Probe Pin

Fabrieksprijs

Goudgeplatte wolfraamelektronica

0.01mm wolfraamdraad

elektronica van molybdeendraad